
An Improved Empirical Large-Signal Model for High-Power GaN HEMTs Including Self-Heating and Charge-Trapping Effects
By Kelvin Yuk, G. R. Branner and David McQuate First appears: IEEE MTT-S Int. Microw. Symp., pp. 753-756, Jun. 2009. A new empirical large-signal model for high-power GaN HEMTs utilizing an improved drain current (Ids) model is presented. The new